地址:深圳市南山区玉泉路麒麟花园英麒苑C-1102室
电话:086-0755-26989323
传真:086-0755-26989323
邮件:james@nanotecchina.com
网站:www.nanotecchina.com
SAM:Scanning Acoustic Microscope
X-Ray:X-Ray Inspection System
DECAP: Auto Cide Decapsulator
RIE: Reactive Iron Etching
Cross Section: Sample preparation
SEM: Scanning Electron Microscopes
Probe Station;/ Auto Curve Tracer EMMI: Emission Microscope
Solder Joint Reliability Thermal Analyzer; / TIM Tester
Bond Tester
HAST and PCT